Information card for entry 7001436

Structure parameters

• Formula: C34 H44 N4 S2 Sn
• Calculated formula: C34 H44 N4 S2 Sn
• SMILES: [Sn](SCc1ccccc1)(SCc1ccccc1)(c1c(N(C)C)cccc1N(C)C)c1c(N(C)C)cccc1N(C)C
• Title of publication: Synthesis and characterisation of twelve SnIV diaryls and formation of a SnIII triaryl
• Authors of publication: Hitchcock, Peter B.; Lappert, Michael F.; Pierssens, Luc J.-M.; Protchenko, Andrey V.; Uiterweerd, Patrick G. H.
• Journal of publication: Dalton Transactions
• Year of publication: 2009
• Journal issue: 23
• Pages of publication: 4578 - 4585
• a: 9.3987 ± 0.0003 Å
• b: 18.6282 ± 0.0007 Å
• c: 19.6314 ± 0.0008 Å
• α: 90°
• β: 94.126 ± 0.002°
• γ: 90°
• Cell volume: 3428.2 ± 0.2 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 9
• Hermann-Mauguin space group symbol: C 1 c 1
• Hall space group symbol: C -2yc
• Residual factor for all reflections: 0.0363
• Residual factor for significantly intense reflections: 0.0311
• Weighted residual factors for significantly intense reflections: 0.065
• Weighted residual factors for all reflections included in the refinement: 0.0677
• Goodness-of-fit parameter for all reflections included in the refinement: 1.025
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No