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Information card for entry 7002085
Preview
| Coordinates | 7002085.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | (iPr2Im)2(Ph)2Ni(ii) |
|---|---|
| Chemical name | (iPr2Im)2(Ph)2Ni(II) |
| Formula | C30 H42 N4 Ni S2 |
| Calculated formula | C30 H42 N4 Ni S2 |
| SMILES | C1(N(C=CN1C(C)C)C(C)C)=[Ni](Sc1ccccc1)(=C1N(C=CN1C(C)C)C(C)C)Sc1ccccc1 |
| Title of publication | Facile C‒S, S‒H, and S‒S bond cleavage using a nickel(0) NHC complex |
| Authors of publication | Schaub, Thomas; Backes, Marc; Plietzsch, Oliver; Radius, Udo |
| Journal of publication | Dalton Transactions |
| Year of publication | 2009 |
| Journal issue | 35 |
| Pages of publication | 7071 |
| a | 10.418 ± 0.002 Å |
| b | 9.6227 ± 0.0019 Å |
| c | 16.036 ± 0.003 Å |
| α | 90° |
| β | 107.33 ± 0.03° |
| γ | 90° |
| Cell volume | 1534.6 ± 0.6 Å3 |
| Cell temperature | 203 ± 2 K |
| Ambient diffraction temperature | 203 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1029 |
| Residual factor for significantly intense reflections | 0.081 |
| Weighted residual factors for significantly intense reflections | 0.2459 |
| Weighted residual factors for all reflections included in the refinement | 0.2745 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7002085.html
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