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Information card for entry 7003212
Preview
| Coordinates | 7003212.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H62 Cs O P3 Si2 |
|---|---|
| Calculated formula | C28 H62 Cs O P3 Si2 |
| SMILES | C(C)(C)([Si](C(C)(C)C)(P=P[P-][Si](C(C)(C)C)(C(C)(C)C)C(C)(C)C)C(C)(C)C)C.[Cs+].C1CCCO1 |
| Title of publication | Isoelectronic caesium compounds: the triphosphenide Cs[tBu3SiPPPSitBu3] and the enolate Cs[OCHCH2] |
| Authors of publication | Lerner, Hans-Wolfram; Sänger, Inge; Schödel, Frauke; Lorbach, Andreas; Bolte, Michael; Wagner, Matthias |
| Journal of publication | Dalton Transactions |
| Year of publication | 2008 |
| Journal issue | 6 |
| Pages of publication | 787 - 792 |
| a | 25.516 ± 0.002 Å |
| b | 12.8382 ± 0.0011 Å |
| c | 11.8824 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3892.4 ± 0.6 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 63 |
| Hermann-Mauguin space group symbol | C m c m |
| Hall space group symbol | -C 2c 2 |
| Residual factor for all reflections | 0.0974 |
| Residual factor for significantly intense reflections | 0.0941 |
| Weighted residual factors for significantly intense reflections | 0.2203 |
| Weighted residual factors for all reflections included in the refinement | 0.2228 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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