Information card for entry 7003577

Structure parameters

• Formula: C12 H28 N Na P2 Te2
• Calculated formula: C12 H28 N Na P2 Te2
• SMILES: [Te]=P(C(C)C)(C(C)C)N=P([Te-])(C(C)C)C(C)C.[Na+]
• Title of publication: Synthesis, NMR characterisation and X-ray structures of mixed chalcogenido PNP ligands containing tellurium: crystal structures of SeiPr2PNP(H)iPr2 and [NaN(EPiPr2)2]∞(E = Se, Te)
• Authors of publication: Robertson, Stuart D.; Chivers, Tristram
• Journal of publication: Dalton Transactions
• Year of publication: 2008
• Journal issue: 13
• Pages of publication: 1765 - 1772
• a: 8.0496 ± 0.0016 Å
• b: 10.349 ± 0.002 Å
• c: 12.897 ± 0.003 Å
• α: 103.58 ± 0.03°
• β: 102.01 ± 0.03°
• γ: 106.27 ± 0.03°
• Cell volume: 958.4 ± 0.5 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0284
• Residual factor for significantly intense reflections: 0.024
• Weighted residual factors for significantly intense reflections: 0.0574
• Weighted residual factors for all reflections included in the refinement: 0.0607
• Goodness-of-fit parameter for all reflections included in the refinement: 1.058
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No