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Information card for entry 7004320
Preview
| Coordinates | 7004320.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H16 Br S8 |
|---|---|
| Calculated formula | C16 H16 Br S8 |
| SMILES | C1(SC=CS1)=C1SC(=C(C)S1)C.[Br-].C1(SC=CS1)=C1SC(=C(C)S1)C |
| Title of publication | A series of strongly one-dimensional organic metals with strictly uniform stacks: (o-DMTTF)2X (X = Cl, Br, I) |
| Authors of publication | Fourmigué, Marc; Reinheimer, Eric W.; Dunbar, Kim R.; Auban-Senzier, Pascale; Pasquier, Claude; Coulon, Claude |
| Journal of publication | Dalton Transactions |
| Year of publication | 2008 |
| Journal issue | 34 |
| Pages of publication | 4652 |
| a | 17.092 ± 0.0003 Å |
| b | 17.092 ± 0.0003 Å |
| c | 7.0582 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2061.96 ± 0.08 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 122 |
| Hermann-Mauguin space group symbol | I -4 2 d |
| Hall space group symbol | I -4 2bw |
| Residual factor for all reflections | 0.0271 |
| Residual factor for significantly intense reflections | 0.024 |
| Weighted residual factors for significantly intense reflections | 0.0578 |
| Weighted residual factors for all reflections included in the refinement | 0.0596 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.163 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7004320.html
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Users of the data should acknowledge the original authors of the
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