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Information card for entry 7004669
Preview
| Coordinates | 7004669.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | mu!2$-(1,2-bis(methylthiomethyl)benzene-S,S')bis(trichlorogallium(III)) |
|---|---|
| Formula | C10 H14 Cl6 Ga2 S2 |
| Calculated formula | C10 H14 Cl6 Ga2 S2 |
| SMILES | C[S](Cc1ccccc1C[S](C)[Ga](Cl)(Cl)Cl)[Ga](Cl)(Cl)Cl |
| Title of publication | Synthesis, characterisation and structures of thio-, seleno- and telluro-ether complexes of gallium(iii) |
| Authors of publication | Gurnani, Chitra; Levason, William; Ratnani, Raju; Reid, Gillian; Webster, Michael |
| Journal of publication | Dalton Transactions |
| Year of publication | 2008 |
| Journal issue | 44 |
| Pages of publication | 6274 - 6282 |
| a | 17.329 ± 0.004 Å |
| b | 10.987 ± 0.002 Å |
| c | 13.041 ± 0.003 Å |
| α | 90° |
| β | 127.542 ± 0.01° |
| γ | 90° |
| Cell volume | 1968.7 ± 0.8 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1039 |
| Residual factor for significantly intense reflections | 0.0547 |
| Weighted residual factors for significantly intense reflections | 0.0896 |
| Weighted residual factors for all reflections included in the refinement | 0.1022 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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