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Information card for entry 7005099
Preview
| Coordinates | 7005099.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H50 In2 N4 |
|---|---|
| Calculated formula | C42 H50 In2 N4 |
| SMILES | C1(=[N](c2c(cccc2C)C)[In](N(C(=C1)C)c1c(cccc1C)C)[In]1N(C(=CC(=[N]1c1c(cccc1C)C)C)C)c1c(cccc1C)C)C |
| Title of publication | Solid- and solution-state structures of indium 'alkene analogues'. |
| Authors of publication | Hill, Michael S.; Hitchcock, Peter B.; Pongtavornpinyo, Ruti |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2007 |
| Journal issue | 7 |
| Pages of publication | 731 - 733 |
| a | 8.6989 ± 0.0005 Å |
| b | 10.0246 ± 0.0006 Å |
| c | 12.3181 ± 0.0007 Å |
| α | 67.338 ± 0.003° |
| β | 82.783 ± 0.003° |
| γ | 83.862 ± 0.003° |
| Cell volume | 981.38 ± 0.1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0407 |
| Residual factor for significantly intense reflections | 0.0325 |
| Weighted residual factors for significantly intense reflections | 0.0725 |
| Weighted residual factors for all reflections included in the refinement | 0.0757 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.057 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7005099.html
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Users of the data should acknowledge the original authors of the
structural data.