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Information card for entry 7005224
Preview
| Coordinates | 7005224.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C60 H56 N4 S8 Te |
|---|---|
| Calculated formula | C60 H56 N4 S8 Te |
| SMILES | c1(ccccc1)CN(C1=[S][Te]234(S1)(SC(=[S]2)N(Cc1ccccc1)Cc1ccccc1)([S]=C(N(Cc1ccccc1)Cc1ccccc1)S3)[S]=C(N(Cc1ccccc1)Cc1ccccc1)S4)Cc1ccccc1 |
| Title of publication | Perfluoroalkyl(dithiocarbamato) tellurium(II) compounds. |
| Authors of publication | Tyrra, Wieland; Naumann, Dieter; Buslei, Sigrid; Kremer, Silke; Pantenburg, Ingo; Scherer, Harald |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2007 |
| Journal issue | 18 |
| Pages of publication | 1829 - 1837 |
| a | 15.406 ± 0.0015 Å |
| b | 15.406 ± 0.0015 Å |
| c | 12.1612 ± 0.0015 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2886.4 ± 0.5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 114 |
| Hermann-Mauguin space group symbol | P -4 21 c |
| Hall space group symbol | P -4 2n |
| Residual factor for all reflections | 0.0851 |
| Residual factor for significantly intense reflections | 0.0436 |
| Weighted residual factors for significantly intense reflections | 0.0756 |
| Weighted residual factors for all reflections included in the refinement | 0.0874 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.95 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7005224.html
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