Information card for entry 7005707
| Formula |
C28 H44 Cl2 N2 O4 Si4 Zr |
| Calculated formula |
C28 H44 Cl2 N2 O4 Si4 Zr |
| SMILES |
[Zr](Cl)(Cl)(N([Si](C)(C)c2oc(cc2)C)[Si](C)(C)c1oc(cc1)C)N([Si](C)(C)c1oc(cc1)C)[Si](C)(C)c1oc(cc1)C |
| Title of publication |
Deactivation pathways of ethylene polymerization catalysts derived from titanium and zirconium 1,3-bis(furyl)-1,1,3,3-tetramethyldisilazide complexes. |
| Authors of publication |
Evans, Lloyd T. J.; Coles, Martyn P.; Geoffrey, F.; Cloke, N.; Hitchcock, Peter B. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2007 |
| Journal issue |
25 |
| Pages of publication |
2707 - 2717 |
| a |
20.2313 ± 0.0008 Å |
| b |
10.0263 ± 0.0004 Å |
| c |
19.8693 ± 0.0005 Å |
| α |
90° |
| β |
115.341 ± 0.002° |
| γ |
90° |
| Cell volume |
3642.6 ± 0.2 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0854 |
| Residual factor for significantly intense reflections |
0.0462 |
| Weighted residual factors for significantly intense reflections |
0.0889 |
| Weighted residual factors for all reflections included in the refinement |
0.1027 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.011 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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