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Information card for entry 7005992
Preview
| Coordinates | 7005992.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H64 N2 O Pb |
|---|---|
| Calculated formula | C44 H64 N2 O Pb |
| SMILES | [Pb]1(Oc2c(cc(cc2C(C)(C)C)C)C(C)(C)C)[N](=C(C=C(N1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | The synthesis of monomeric terminal lead aryloxides: dependence on reagents and conditions. |
| Authors of publication | Fulton, J. Robin; Hitchcock, Peter B.; Johnstone, Nick C.; Tam, Eric C. Y. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2007 |
| Journal issue | 31 |
| Pages of publication | 3360 - 3362 |
| a | 12.3312 ± 0.0002 Å |
| b | 12.5867 ± 0.0002 Å |
| c | 15.1185 ± 0.0003 Å |
| α | 105.315 ± 0.001° |
| β | 100.911 ± 0.001° |
| γ | 108.965 ± 0.001° |
| Cell volume | 2040.66 ± 0.07 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0272 |
| Residual factor for significantly intense reflections | 0.0234 |
| Weighted residual factors for significantly intense reflections | 0.05 |
| Weighted residual factors for all reflections included in the refinement | 0.0513 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7005992.html
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