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Information card for entry 7006079
Preview
| Coordinates | 7006079.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | trans-tetrachlorobis(diethylselenide)tin(IV) |
|---|---|
| Formula | C8 H20 Cl4 Se2 Sn |
| Calculated formula | C8 H20 Cl4 Se2 Sn |
| SMILES | C(C)[Se](CC)[Sn](Cl)(Cl)(Cl)(Cl)[Se](CC)CC |
| Title of publication | Thio- and seleno-ether complexes with Group 4 tetrahalides and tin tetrachloride: preparation and use in CVD for metal chalcogenide films. |
| Authors of publication | Reid, Stuart D.; Hector, Andrew L.; Levason, William; Reid, Gillian; Waller, Benjamin J.; Webster, Michael |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2007 |
| Journal issue | 42 |
| Pages of publication | 4769 - 4777 |
| a | 7.1244 ± 0.001 Å |
| b | 11.5362 ± 0.001 Å |
| c | 10.2435 ± 0.001 Å |
| α | 90° |
| β | 97.662 ± 0.006° |
| γ | 90° |
| Cell volume | 834.38 ± 0.16 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0238 |
| Residual factor for significantly intense reflections | 0.0229 |
| Weighted residual factors for significantly intense reflections | 0.0558 |
| Weighted residual factors for all reflections included in the refinement | 0.0563 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.128 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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