Information card for entry 7006082

Structure parameters

• Formula: C33 H56 Lu N O3 S Si
• Calculated formula: C33 H56 Lu N O3 S Si
• SMILES: [Lu]1([O]2CCCC2)([O]2CCCC2)([O]2CCCC2)(N(Cc2sccc12)c1c(C(C)C)cccc1C(C)C)C[Si](C)(C)C
• Title of publication: Rare earth metal complexes bearing thiophene-amido ligand: synthesis and structural characterization.
• Authors of publication: Wang, Dun; Cui, Dongmei; Miao, Wei; Li, Shihui; Huang, Baotong
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2007
• Journal issue: 40
• Pages of publication: 4576 - 4581
• a: 17.1191 ± 0.0014 Å
• b: 13.0059 ± 0.0011 Å
• c: 19.0227 ± 0.0016 Å
• α: 90°
• β: 97.561 ± 0.001°
• γ: 90°
• Cell volume: 4198.6 ± 0.6 ų
• Cell temperature: 187 ± 2 K
• Ambient diffraction temperature: 187 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0364
• Residual factor for significantly intense reflections: 0.0303
• Weighted residual factors for significantly intense reflections: 0.0784
• Weighted residual factors for all reflections included in the refinement: 0.0809
• Goodness-of-fit parameter for all reflections included in the refinement: 0.988
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No