Information card for entry 7006482

Structure parameters

• Formula: C22 H24 F6 N2 Ni O4 S2
• Calculated formula: C22 H24 F6 N2 Ni O4 S2
• SMILES: [Ni]123(OC(=CC(=[O]1)c1sccc1)C(F)(F)F)(OC(=CC(=[O]2)c1sccc1)C(F)(F)F)[N](C)(C)CC[N]3(C)C
• Title of publication: Synthesis, characterization and application of Ni(tta)2.tmeda to MOCVD of nickel oxide thin films.
• Authors of publication: Malandrino, Graziella; Perdicaro, Laura M. S.; Condorelli, Giuseppe; Fragalà, Ignazio L; Rossi, Patrizia; Dapporto, Paolo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2006
• Journal issue: 8
• Pages of publication: 1101 - 1106
• a: 11.867 ± 0.007 Å
• b: 15.421 ± 0.003 Å
• c: 15.174 ± 0.005 Å
• α: 90°
• β: 92.48 ± 0.02°
• γ: 90°
• Cell volume: 2774 ± 2 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.2519
• Residual factor for significantly intense reflections: 0.0837
• Weighted residual factors for significantly intense reflections: 0.1426
• Weighted residual factors for all reflections included in the refinement: 0.1882
• Goodness-of-fit parameter for all reflections included in the refinement: 0.861
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No