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Information card for entry 7006562
Preview
| Coordinates | 7006562.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Compound 4 |
|---|---|
| Formula | C54 H72 Co3 N14 O8 S6 |
| Calculated formula | C55.5 H72 Co3 N14 O8 S6 |
| Title of publication | Ligating properties of a potentially tetradentate Schiff base [(CH3)2NCH2CH2N=CHC6H3(OH)(OMe)] with zinc(II), cadmium(II), cobalt(II), cobalt(III) and manganese(III) ions: synthesis and structural studies. |
| Authors of publication | Sen, Soma; Talukder, Pritha; Dey, Subrata K.; Mitra, Samiran; Rosair, Georgina; Hughes, David L.; Yap, Glenn P. A.; Pilet, Guillaume; Gramlich, V.; Matsushita, T. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2006 |
| Journal issue | 14 |
| Pages of publication | 1758 - 1767 |
| a | 14.227 ± 0.018 Å |
| b | 19.468 ± 0.02 Å |
| c | 13.857 ± 0.018 Å |
| α | 104.05 ± 0.09° |
| β | 93.52 ± 0.11° |
| γ | 109.48 ± 0.08° |
| Cell volume | 3467 ± 8 Å3 |
| Cell temperature | 296.2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2345 |
| Residual factor for significantly intense reflections | 0.0594 |
| Weighted residual factors for significantly intense reflections | 0.1464 |
| Weighted residual factors for all reflections included in the refinement | 0.182 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.865 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | Mo-Kα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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