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Information card for entry 7006842
Preview
| Coordinates | 7006842.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | (Na(thf)6)(Na(thf)5)((Si(NCH2tBu)2C6H4)3) |
|---|---|
| Formula | C92 H166 N6 Na2 O11 Si3 |
| Calculated formula | C92.04 H138 N6 Na2 O11 Si3 |
| Title of publication | Insights into the making of a stable silylene. |
| Authors of publication | Gehrhus, Barbara; Hitchcock, Peter B.; Pongtavornpinyo, Ruti; Zhang, Lihong |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2006 |
| Journal issue | 15 |
| Pages of publication | 1847 - 1857 |
| a | 15.0722 ± 0.0001 Å |
| b | 15.0722 ± 0.0001 Å |
| c | 25.4341 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 5003.8 ± 0.08 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 176 |
| Hermann-Mauguin space group symbol | P 63/m |
| Hall space group symbol | -P 6c |
| Residual factor for all reflections | 0.076 |
| Residual factor for significantly intense reflections | 0.0671 |
| Weighted residual factors for significantly intense reflections | 0.1858 |
| Weighted residual factors for all reflections included in the refinement | 0.1932 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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