Information card for entry 7010891

Structure parameters

• Formula: C73 H62 Cl2 F0 N2 O6 P4 Pb Pt2 Se2
• Calculated formula: C73 H62 Cl2 N2 O6 P4 Pb Pt2 Se2
• SMILES: [Pb]123([Se]4[Pt]([Se]1[Pt]4([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1)(ON(=[O]3)=O)ON(=[O]2)=O.C(Cl)Cl
• Title of publication: Exploring the Lewis basicity of the metalloligand [Pt2(μ-Se)2(PPh3)4] on metal substrates by electrospray mass spectrometry. Synthesis, characterization and structural studies of new platinum selenido phosphine complexes containing the {Pt2Se2} core
• Authors of publication: Jeremy S. L. Yeo; Jagadese J. Vittal; William Henderson; T. S. Andy Hor
• Journal of publication: J. Chem. Soc., Dalton Trans.
• Year of publication: 2002
• Journal issue: 3
• Pages of publication: 328 - 336
• a: 12.177 ± 0.0002 Å
• b: 16.8986 ± 0.0003 Å
• c: 17.5281 ± 0.0003 Å
• α: 75.202 ± 0.001°
• β: 87.163 ± 0.001°
• γ: 89.219 ± 0.001°
• Cell volume: 3482.93 ± 0.1 ų
• Cell temperature: 223 ± 2 K
• Ambient diffraction temperature: 223 ± 2 K
• Number of distinct elements: 10
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0892
• Residual factor for significantly intense reflections: 0.0519
• Weighted residual factors for significantly intense reflections: 0.0853
• Weighted residual factors for all reflections included in the refinement: 0.0973
• Goodness-of-fit parameter for all reflections included in the refinement: 0.989
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No