Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7011639
Preview
| Coordinates | 7011639.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H32 Cl2 Cu N2 |
|---|---|
| Calculated formula | C40 H32 Cl2 Cu N2 |
| SMILES | [Cu]1(Cl)(Cl)[N](=C(C(=[N]1c1c(cccc1c1ccccc1)c1ccccc1)C)C)c1c(cccc1c1ccccc1)c1ccccc1 |
| Title of publication | Ethylene polymerisation by a copper catalyst bearing α-diimine ligands |
| Authors of publication | Gibson, Vernon C.; Tomov, Atanas; Wass, Duncan F.; White, Andrew J. P.; Williams, David J. |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2002 |
| Journal issue | 11 |
| Pages of publication | 2261 |
| a | 11.3714 ± 0.0003 Å |
| b | 14.5373 ± 0.0007 Å |
| c | 20.1934 ± 0.0009 Å |
| α | 90° |
| β | 92.238 ± 0.006° |
| γ | 90° |
| Cell volume | 3335.6 ± 0.2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0596 |
| Residual factor for significantly intense reflections | 0.0421 |
| Weighted residual factors for all reflections | 0.1134 |
| Weighted residual factors for significantly intense reflections | 0.0975 |
| Goodness-of-fit parameter for all reflections | 1.023 |
| Goodness-of-fit parameter for significantly intense reflections | 1.072 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7011639.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.