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Information card for entry 7012524
Preview
| Coordinates | 7012524.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H49 Cl5 Ge N2 Se |
|---|---|
| Calculated formula | C31 H45 Cl5 Ge N2 Se |
| SMILES | [Se]=[Ge]1(Cl)N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C.ClCCl.ClCCl |
| Title of publication | Syntheses, structures and properties of [{HC(CMeNAr)2}Ge(E)X] (Ar = 2,6-iPr2C6H3; E = S, Se; X = F, Cl) |
| Authors of publication | Ding, Yuqiang; Ma, Qingjun; Roesky, Herbert W.; Usón, Isabel; Noltemeyer, Mathias; Schmidt, Hans-Georg |
| Journal of publication | Dalton Transactions |
| Year of publication | 2003 |
| Journal issue | 6 |
| Pages of publication | 1094 |
| a | 13.176 ± 0.003 Å |
| b | 15.269 ± 0.003 Å |
| c | 18.045 ± 0.004 Å |
| α | 90° |
| β | 91.44 ± 0.03° |
| γ | 90° |
| Cell volume | 3629.2 ± 1.4 Å3 |
| Cell temperature | 133 ± 2 K |
| Ambient diffraction temperature | 133 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0553 |
| Residual factor for significantly intense reflections | 0.0365 |
| Weighted residual factors for significantly intense reflections | 0.0834 |
| Weighted residual factors for all reflections included in the refinement | 0.0928 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7012524.html
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