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Information card for entry 7012595
Preview
| Coordinates | 7012595.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | C40 H56 B Ni O S3, CH3CN |
|---|---|
| Formula | C42 H59 B N Ni O S3 |
| Calculated formula | C42 H59 B N Ni O S3 |
| SMILES | [Ni]12([S](C[B](C[S]1C13CC4CC(C3)CC(C1)C4)(C[S]2C12CC3CC(C2)CC(C1)C3)c1ccccc1)C12CC3CC(C2)CC(C1)C3)C#[O].CC#N |
| Title of publication | Thioether-ligated nickel(i) complexes for the activation of dioxygenBased on the presentation given at Dalton Discussion No. 5, 10?12th April 2003, Noordwijkerhout, The Netherlands. |
| Authors of publication | Fujita, Koyu; Rheingold, Arnold L.; Riordan, Charles G. |
| Journal of publication | Dalton Transactions |
| Year of publication | 2003 |
| Journal issue | 10 |
| Pages of publication | 2004 |
| a | 13.917 ± 0.004 Å |
| b | 11.629 ± 0.003 Å |
| c | 23.722 ± 0.007 Å |
| α | 90° |
| β | 94.156 ± 0.006° |
| γ | 90° |
| Cell volume | 3829.1 ± 1.9 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0989 |
| Residual factor for significantly intense reflections | 0.0624 |
| Weighted residual factors for significantly intense reflections | 0.1377 |
| Weighted residual factors for all reflections included in the refinement | 0.1545 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.012 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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