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Information card for entry 7012692
Preview
| Coordinates | 7012692.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [Yb{Me3SiNC(Ad)CHC(PhMe)NSiMe3}2] |
|---|---|
| Formula | C52 H82 N4 Si4 Yb |
| Calculated formula | C52 H82 N4 Si4 Yb |
| Title of publication | Synthesis and structures of the ytterbium(ii) β-diketiminates [Yb{N(SiMe3)C(R2)C(H)C(R4)N(SiMe3)}2] (R2 = R4 = Ph, C6H4Me-4, or C6H4Ph-4; or R2 = C6H4Me-4, R4 = 1-adamantyl) |
| Authors of publication | Avent, Anthony G.; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V. |
| Journal of publication | Dalton Transactions |
| Year of publication | 2003 |
| Journal issue | 6 |
| Pages of publication | 1070 |
| a | 12.7363 ± 0.0005 Å |
| b | 13.1615 ± 0.0006 Å |
| c | 16.5277 ± 0.0011 Å |
| α | 85.738 ± 0.003° |
| β | 82.722 ± 0.004° |
| γ | 82.784 ± 0.004° |
| Cell volume | 2721.6 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0941 |
| Residual factor for significantly intense reflections | 0.0738 |
| Weighted residual factors for significantly intense reflections | 0.1854 |
| Weighted residual factors for all reflections included in the refinement | 0.199 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.