Information card for entry 7012694

Structure parameters

• Common name: [Yb{Me3SiNC(C6H4Ph)CHC(C6H4Ph)NSiMe3)}2]]
• Formula: C66 H74 N4 Si4 Yb
• Calculated formula: C66 H74 N4 Si4 Yb
• SMILES: [Yb]12(N([Si](C)(C)C)C(=CC(=[N]1[Si](C)(C)C)c1ccc(cc1)c1ccccc1)c1ccc(cc1)c1ccccc1)[N]([Si](C)(C)C)=C(C=C(N2[Si](C)(C)C)c1ccc(cc1)c1ccccc1)c1ccc(cc1)c1ccccc1
• Title of publication: Synthesis and structures of the ytterbium(ii) β-diketiminates [Yb{N(SiMe3)C(R2)C(H)C(R4)N(SiMe3)}2] (R2 = R4 = Ph, C6H4Me-4, or C6H4Ph-4; or R2 = C6H4Me-4, R4 = 1-adamantyl)
• Authors of publication: Avent, Anthony G.; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V.
• Journal of publication: Dalton Transactions
• Year of publication: 2003
• Journal issue: 6
• Pages of publication: 1070
• a: 12.1373 ± 0.0003 Å
• b: 22.1348 ± 0.0005 Å
• c: 23.2872 ± 0.0003 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 6256.3 ± 0.2 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 33
• Hermann-Mauguin space group symbol: P n a 21
• Hall space group symbol: P 2c -2n
• Residual factor for all reflections: 0.0659
• Residual factor for significantly intense reflections: 0.0413
• Weighted residual factors for significantly intense reflections: 0.0762
• Weighted residual factors for all reflections included in the refinement: 0.0846
• Goodness-of-fit parameter for all reflections included in the refinement: 1.019
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No