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Information card for entry 7012764
Preview
| Coordinates | 7012764.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [{AlMe2(PhNSiMe3)}2] |
|---|---|
| Formula | C22 H40 Al2 N2 Si2 |
| Calculated formula | C22 H40 Al2 N2 Si2 |
| SMILES | [Al]1([N]([Si](C)(C)C)(c2ccccc2)[Al]([N]1([Si](C)(C)C)c1ccccc1)(C)C)(C)C |
| Title of publication | A comparative study of the behaviour of N-trimethylsilyl and N-neopentyl-anilines and 1,2-diaminobenzenes towards trimethylalane; X-ray structures of nine Al‒N compounds |
| Authors of publication | Bezombes, Jean-Philippe; Gehrhus, Barbara; Hitchcock, Peter B.; Lappert, Michael F.; Merle, Philippe G. |
| Journal of publication | Dalton Transactions |
| Year of publication | 2003 |
| Journal issue | 9 |
| Pages of publication | 1821 |
| a | 17.2628 ± 0.0003 Å |
| b | 17.2628 ± 0.0003 Å |
| c | 18.0235 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5371.1 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 114 |
| Hermann-Mauguin space group symbol | P -4 21 c |
| Hall space group symbol | P -4 2n |
| Residual factor for all reflections | 0.0592 |
| Residual factor for significantly intense reflections | 0.0431 |
| Weighted residual factors for significantly intense reflections | 0.092 |
| Weighted residual factors for all reflections included in the refinement | 0.0994 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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