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Information card for entry 7013408
Preview
| Coordinates | 7013408.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H18 Cu N6 S2 |
|---|---|
| Calculated formula | C10 H18 Cu N6 S2 |
| SMILES | [Cu]123[N](=C(C(C)=[N]3N=C(S1)N(C)C)C)N=C(S2)N(C)C |
| Title of publication | Structural trends in copper(II) bis(thiosemicarbazone) radiopharmaceuticals |
| Authors of publication | Blower, Philip J.; Castle, Thomas C.; Cowley, Andrew R.; Dilworth, Jonathan R.; Donnelly, Paul S.; Labisbal, Elena; Sowrey, Frank E.; Teat, Simon J.; Went, Michael J. |
| Journal of publication | Dalton Transactions |
| Year of publication | 2003 |
| Journal issue | 23 |
| Pages of publication | 4416 - 4425 |
| a | 7.3791 ± 0.0003 Å |
| b | 8.502 ± 0.0004 Å |
| c | 11.9417 ± 0.0005 Å |
| α | 104.281 ± 0.002° |
| β | 97.775 ± 0.002° |
| γ | 90.63 ± 0.002° |
| Cell volume | 718.59 ± 0.05 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0451 |
| Residual factor for significantly intense reflections | 0.0407 |
| Weighted residual factors for significantly intense reflections | 0.1048 |
| Weighted residual factors for all reflections included in the refinement | 0.1061 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.985 |
| Diffraction radiation wavelength | 0.6904 Å |
| Diffraction radiation type | Synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7013408.html
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Users of the data should acknowledge the original authors of the
structural data.