Information card for entry 7013965

Structure parameters

• Common name: [CeCl{Me3SiNC(Ph)CHC(Ph)NSiMe3}2]
• Formula: C42 H58 Ce Cl N4 Si4
• Calculated formula: C42 H58 Ce Cl N4 Si4
• SMILES: [Ce]12(Cl)([N]([Si](C)(C)C)=C(C=C(N1[Si](C)(C)C)c1ccccc1)c1ccccc1)[N]([Si](C)(C)C)=C(C=C(N2[Si](C)(C)C)c1ccccc1)c1ccccc1
• Title of publication: Synthetic and structural experiments on yttrium, cerium and magnesium trimethylsilylmethyls and their reaction products with nitriles; with a note on two cerium beta-diketiminates.
• Authors of publication: Avent, Anthony G.; Caro, Catherine F.; Hitchcock, Peter B.; Lappert, Michael F.; Li, Zhengning; Wei, Xue-Hong
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2004
• Journal issue: 10
• Pages of publication: 1567 - 1577
• a: 11.9825 ± 0.0009 Å
• b: 12.4284 ± 0.001 Å
• c: 15.9086 ± 0.0015 Å
• α: 94.607 ± 0.004°
• β: 94.084 ± 0.005°
• γ: 90.114 ± 0.004°
• Cell volume: 2355.4 ± 0.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1252
• Residual factor for significantly intense reflections: 0.0689
• Weighted residual factors for significantly intense reflections: 0.107
• Weighted residual factors for all reflections included in the refinement: 0.1271
• Goodness-of-fit parameter for all reflections included in the refinement: 1.01
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No