Information card for entry 7014012

Structure parameters

• Common name: [Y(thf){N(SiMe3)2}{C6H3iPr2N(CH2)3NC6H3iPr2}]
• Formula: C37 H66 N3 O Si2 Y
• Calculated formula: C37 H66 N3 O Si2 Y
• SMILES: [Y]1([O]2CCCC2)(N(CCCN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)N([Si](C)(C)C)[Si](C)(C)C
• Title of publication: Yttrium complexes incorporating the chelating diamides [ArN(CH2)xNAr]2- (Ar = C6H3-2,6-iPr2, x= 2, 3) and their unusual reaction with phenylsilane.
• Authors of publication: Avent, Anthony G.; Cloke, F Geoffrey N; Elvidge, Benjamin R.; Hitchcock, Peter B.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2004
• Journal issue: 7
• Pages of publication: 1083 - 1096
• a: 11.0609 ± 0.0004 Å
• b: 17.1207 ± 0.0006 Å
• c: 11.3288 ± 0.0004 Å
• α: 90°
• β: 106.524 ± 0.002°
• γ: 90°
• Cell volume: 2056.74 ± 0.13 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 4
• Hermann-Mauguin space group symbol: P 1 21 1
• Hall space group symbol: P 2yb
• Residual factor for all reflections: 0.0497
• Residual factor for significantly intense reflections: 0.0418
• Weighted residual factors for significantly intense reflections: 0.0958
• Weighted residual factors for all reflections included in the refinement: 0.1009
• Goodness-of-fit parameter for all reflections included in the refinement: 1.03
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No