Information card for entry 7014014

Structure parameters

• Common name: [{YI(thf)2(C6H3iPr2NCH2CH2NC6H3iPr2)}2].2.5(toluene)
• Formula: C85.5 H128 I2 N4 O4 Y2
• Calculated formula: C85.5 H124 I2 N4 O4 Y2
• Title of publication: Yttrium complexes incorporating the chelating diamides [ArN(CH2)xNAr]2- (Ar = C6H3-2,6-iPr2, x= 2, 3) and their unusual reaction with phenylsilane.
• Authors of publication: Avent, Anthony G.; Cloke, F Geoffrey N; Elvidge, Benjamin R.; Hitchcock, Peter B.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2004
• Journal issue: 7
• Pages of publication: 1083 - 1096
• a: 12.225 ± 0.0004 Å
• b: 14.244 ± 0.0004 Å
• c: 25.3516 ± 0.0009 Å
• α: 78.418 ± 0.001°
• β: 80.205 ± 0.001°
• γ: 85.201 ± 0.002°
• Cell volume: 4256 ± 0.2 ų
• Cell temperature: 223 ± 2 K
• Ambient diffraction temperature: 223 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.1288
• Residual factor for significantly intense reflections: 0.1027
• Weighted residual factors for significantly intense reflections: 0.2078
• Weighted residual factors for all reflections included in the refinement: 0.2173
• Goodness-of-fit parameter for all reflections included in the refinement: 1.266
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No