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Information card for entry 7014019
Preview
| Coordinates | 7014019.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [Y(thf)(OC6H2tBu2Me)(C6H3iPr2N(CH2)3NC6H3iPr2)] |
|---|---|
| Formula | C46 H63 N2 O2 Y |
| Calculated formula | C46 H63 N2 O2 Y |
| Title of publication | Yttrium complexes incorporating the chelating diamides [ArN(CH2)xNAr]2- (Ar = C6H3-2,6-iPr2, x= 2, 3) and their unusual reaction with phenylsilane. |
| Authors of publication | Avent, Anthony G.; Cloke, F Geoffrey N; Elvidge, Benjamin R.; Hitchcock, Peter B. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2004 |
| Journal issue | 7 |
| Pages of publication | 1083 - 1096 |
| a | 9.7063 ± 0.0002 Å |
| b | 24.9099 ± 0.0006 Å |
| c | 18.6024 ± 0.0004 Å |
| α | 90° |
| β | 97.802 ± 0.001° |
| γ | 90° |
| Cell volume | 4456.11 ± 0.17 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1055 |
| Residual factor for significantly intense reflections | 0.061 |
| Weighted residual factors for significantly intense reflections | 0.1164 |
| Weighted residual factors for all reflections included in the refinement | 0.1361 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7014019.html
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