Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7014591
Preview
| Coordinates | 7014591.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38.5 H32 Cl F6 N2 O3 P2 Re |
|---|---|
| Calculated formula | C38.5 H32 Cl F6 N2 O3 P2 Re |
| Title of publication | Re(V) and Re(III) complexes with sal2phen and triphenylphosphine: rearrangement, oxidation and reduction. |
| Authors of publication | Lane, Stephanie Renee; Sisay, Nebiat; Carney, Brett; Dannoon, Shorouk; Williams, Stephen; Engelbrecht, Hendrik Petrus; Barnes, Charles Leslie; Jurisson, Silvia Sabine |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2011 |
| Journal volume | 40 |
| Journal issue | 1 |
| Pages of publication | 269 - 276 |
| a | 21.0703 ± 0.0015 Å |
| b | 11.378 ± 0.0008 Å |
| c | 15.0859 ± 0.0011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3616.7 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 34 |
| Hermann-Mauguin space group symbol | P n n 2 |
| Hall space group symbol | P 2 -2n |
| Residual factor for all reflections | 0.0602 |
| Residual factor for significantly intense reflections | 0.0374 |
| Weighted residual factors for significantly intense reflections | 0.0608 |
| Weighted residual factors for all reflections included in the refinement | 0.0662 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7014591.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.