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Information card for entry 7015795
Preview
| Coordinates | 7015795.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H16 Br Cu N4 Se2 |
|---|---|
| Calculated formula | C10 H16 Br Cu N4 Se2 |
| SMILES | CN1C(=[Se][Cu](Br)[Se]=C2N(C=CN2C)C)N(C=C1)C |
| Title of publication | Synthesis, characterization, and DFT studies of thione and selone Cu(I) complexes with variable coordination geometries. |
| Authors of publication | Kimani, Martin M.; Bayse, Craig A.; Brumaghim, Julia L. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2011 |
| Journal volume | 40 |
| Journal issue | 14 |
| Pages of publication | 3711 - 3723 |
| a | 10.297 ± 0.002 Å |
| b | 10.39 ± 0.002 Å |
| c | 14.824 ± 0.003 Å |
| α | 90° |
| β | 101.47 ± 0.03° |
| γ | 90° |
| Cell volume | 1554.3 ± 0.6 Å3 |
| Cell temperature | 173.15 ± 0.02 K |
| Ambient diffraction temperature | 173.15 ± 0.02 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0437 |
| Residual factor for significantly intense reflections | 0.0389 |
| Weighted residual factors for significantly intense reflections | 0.0906 |
| Weighted residual factors for all reflections included in the refinement | 0.0955 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.114 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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