Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7017236
Preview
| Coordinates | 7017236.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H31 Cu I N5 O4 |
|---|---|
| Calculated formula | C26 H31 Cu I N5 O4 |
| SMILES | [Cu]1(I)([n]2c3ccc4ccc5ccc([n]1c5c24)C(=O)NCCCOCCCCOCCCNC3=O)[N]#CC |
| Title of publication | Inhibiting copper(i) iodide aggregate assembly in the solid state via macrocyclic encapsulation. |
| Authors of publication | Smith, David J.; Blake, Alexander J.; Wilson, Claire; Champness, Neil R. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2011 |
| Journal volume | 40 |
| Journal issue | 45 |
| Pages of publication | 12257 - 12264 |
| a | 9.4406 ± 0.0005 Å |
| b | 11.3913 ± 0.0006 Å |
| c | 12.9336 ± 0.0007 Å |
| α | 94.923 ± 0.001° |
| β | 96.118 ± 0.001° |
| γ | 97.922 ± 0.001° |
| Cell volume | 1362.62 ± 0.13 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0231 |
| Residual factor for significantly intense reflections | 0.0217 |
| Weighted residual factors for significantly intense reflections | 0.0557 |
| Weighted residual factors for all reflections included in the refinement | 0.0566 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7017236.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.