Information card for entry 7017662
| Formula |
C18 H10 Cl F5 N2 S Si |
| Calculated formula |
C18 H10 Cl F5 N2 S Si |
| SMILES |
c1(c(c(c(c(c1F)F)F)F)F)[Si]12(Cl)N(c3c(cccc3)S2)Cc2cccc[n]12 |
| Title of publication |
Synthesis and structural characterisation of neutral pentacoordinate silicon(iv) complexes with a tridentate dianionic N,N,S chelate ligand. |
| Authors of publication |
Kobelt, Claudia; Burschka, Christian; Bertermann, Rüdiger; Fonseca Guerra, C.; Bickelhaupt, F. Matthias; Tacke, Reinhold |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2012 |
| Journal volume |
41 |
| Journal issue |
7 |
| Pages of publication |
2148 - 2162 |
| a |
7.7449 ± 0.001 Å |
| b |
15.308 ± 0.002 Å |
| c |
15.082 ± 0.002 Å |
| α |
90° |
| β |
98.831 ± 0.015° |
| γ |
90° |
| Cell volume |
1766.9 ± 0.4 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0452 |
| Residual factor for significantly intense reflections |
0.0348 |
| Weighted residual factors for significantly intense reflections |
0.0912 |
| Weighted residual factors for all reflections included in the refinement |
0.0957 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.078 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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