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Information card for entry 7019844
Preview
| Coordinates | 7019844.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H26 N2 O2 Sn2 |
|---|---|
| Calculated formula | C18 H26 N2 O2 Sn2 |
| SMILES | [Sn]1([N]([Sn]([N]1(C)C)Oc1ccccc1C)(C)C)Oc1ccccc1C |
| Title of publication | Tin(ii) amide/alkoxide coordination compounds for production of Sn-based nanowires for lithium ion battery anode materials. |
| Authors of publication | Boyle, Timothy J.; Doan, Thu Q.; Steele, Leigh Anna M.; Apblett, Christopher; Hoppe, Sarah M.; Hawthorne, Krista; Kalinich, Robin M.; Sigmund, Wolfgang M. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2012 |
| Journal volume | 41 |
| Journal issue | 31 |
| Pages of publication | 9349 - 9364 |
| a | 26.984 ± 0.003 Å |
| b | 7.4491 ± 0.0007 Å |
| c | 21.522 ± 0.002 Å |
| α | 90° |
| β | 106.458 ± 0.002° |
| γ | 90° |
| Cell volume | 4148.8 ± 0.7 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.04 |
| Residual factor for significantly intense reflections | 0.0332 |
| Weighted residual factors for significantly intense reflections | 0.0689 |
| Weighted residual factors for all reflections included in the refinement | 0.0716 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.15 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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