Information card for entry 7020204
| Chemical name |
tetrachloro(1,2-bis(methylsulfanylmethyl)benzene-S,S')tellurium(IV) |
| Formula |
C10 H14 Cl4 S2 Te |
| Calculated formula |
C10 H14 Cl4 S2 Te |
| SMILES |
c1(ccccc1C[S]1C)C[S](C)[Te]1(Cl)(Cl)(Cl)Cl |
| Title of publication |
TeX4 (X = F, Cl, Br) as Lewis acids–complexes with soft thio- and seleno-ether ligands. |
| Authors of publication |
Hector, Andrew L.; Jolleys, Andrew; Levason, William; Reid, Gillian |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2012 |
| Journal volume |
41 |
| Journal issue |
36 |
| Pages of publication |
10988 - 10999 |
| a |
19.451 ± 0.003 Å |
| b |
11.603 ± 0.002 Å |
| c |
7.1757 ± 0.001 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1619.5 ± 0.4 Å3 |
| Cell temperature |
120 ± 2 K |
| Ambient diffraction temperature |
120 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
62 |
| Hermann-Mauguin space group symbol |
P n m a |
| Hall space group symbol |
-P 2ac 2n |
| Residual factor for all reflections |
0.0215 |
| Residual factor for significantly intense reflections |
0.0196 |
| Weighted residual factors for significantly intense reflections |
0.0419 |
| Weighted residual factors for all reflections included in the refinement |
0.0428 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.131 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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