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Information card for entry 7021180
Preview
| Coordinates | 7021180.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H22 Cl2 Cu N5 O9 |
|---|---|
| Calculated formula | C20 H22 Cl2 Cu N5 O9 |
| SMILES | [Cu]1234[n]5c(C[N]1(CC[NH]2Cc1[n]3cccc1)Cc1[n]4cccc1)cccc5.Cl(=O)(=O)(=O)[O-].O.Cl(=O)(=O)(=O)[O-] |
| Title of publication | Nitric oxide reactivity of Cu(ii) complexes of tetra- and pentadentate ligands: structural influence in deciding the reduction pathway. |
| Authors of publication | Kumar, Pankaj; Kalita, Apurba; Mondal, Biplab |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 16 |
| Pages of publication | 5731 - 5739 |
| a | 8.7895 ± 0.0003 Å |
| b | 12.8229 ± 0.0005 Å |
| c | 11.1763 ± 0.0005 Å |
| α | 90° |
| β | 94.308 ± 0.002° |
| γ | 90° |
| Cell volume | 1256.09 ± 0.09 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 7 |
| Hermann-Mauguin space group symbol | P 1 n 1 |
| Hall space group symbol | P -2yac |
| Residual factor for all reflections | 0.0719 |
| Residual factor for significantly intense reflections | 0.0454 |
| Weighted residual factors for significantly intense reflections | 0.1098 |
| Weighted residual factors for all reflections included in the refinement | 0.1192 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.906 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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