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Information card for entry 7022099
Preview
| Coordinates | 7022099.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21 H42 O4 Pt Si |
|---|---|
| Calculated formula | C21 H42 O4 Pt Si |
| SMILES | [Pt]123(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)([CH]4=[CH]2CC[CH]3=[CH]1CC4)C |
| Title of publication | From well-defined Pt(II) surface species to the controlled growth of silica supported Pt nanoparticles. |
| Authors of publication | Laurent, Pierre; Veyre, Laurent; Thieuleux, Chloé; Donet, Sébastien; Copéret, Christophe |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 1 |
| Pages of publication | 238 - 248 |
| a | 9.465 ± 0.001 Å |
| b | 8.6144 ± 0.0009 Å |
| c | 30.436 ± 0.003 Å |
| α | 90° |
| β | 95.187 ± 0.009° |
| γ | 90° |
| Cell volume | 2471.4 ± 0.4 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0656 |
| Residual factor for significantly intense reflections | 0.0473 |
| Weighted residual factors for all reflections | 0.149 |
| Weighted residual factors for significantly intense reflections | 0.1188 |
| Weighted residual factors for all reflections included in the refinement | 0.149 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9917 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7022099.html
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Users of the data should acknowledge the original authors of the
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