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Information card for entry 7022267
Preview
| Coordinates | 7022267.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H30 N2 O Zn |
|---|---|
| Calculated formula | C22 H30 N2 O Zn |
| SMILES | [Zn]1(Oc2c3c(cc4ccccc24)cccc3)(CC)[N](C)(C)CC[N]1(C)C |
| Title of publication | Structural elucidation of homometallic anthracenolates synthesised via deprotonative metallation of anthrone. |
| Authors of publication | Clegg, William; Fleming, Ben J.; García-Álvarez, Pablo; Hogg, Lorna M.; Kennedy, Alan R.; Klett, Jan; Martínez-Martínez, Antonio J; Mulvey, Robert E.; Russo, Luca; O'Hara, Charles T |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 7 |
| Pages of publication | 2512 - 2519 |
| a | 12.2484 ± 0.0009 Å |
| b | 13.6732 ± 0.0007 Å |
| c | 12.7425 ± 0.0009 Å |
| α | 90° |
| β | 108.087 ± 0.008° |
| γ | 90° |
| Cell volume | 2028.6 ± 0.2 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0519 |
| Residual factor for significantly intense reflections | 0.0296 |
| Weighted residual factors for significantly intense reflections | 0.0628 |
| Weighted residual factors for all reflections included in the refinement | 0.0657 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.908 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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