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Information card for entry 7022580
Preview
| Coordinates | 7022580.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31.88 H42.5 Cr N3 |
|---|---|
| Calculated formula | C30 H38 Cr N3 |
| SMILES | [Cr]12([N](c3c(cccc3C)C)=C(C)C=C(N1c1c(cccc1C)C)C)([n]1ccccc1)CCCC2 |
| Title of publication | A well-defined model system for the chromium-catalyzed selective oligomerization of ethylene. |
| Authors of publication | Monillas, Wesley H.; Young, John F.; Yap, Glenn P. A.; Theopold, Klaus H. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 25 |
| Pages of publication | 9198 - 9210 |
| a | 11.96 ± 0.006 Å |
| b | 14.191 ± 0.007 Å |
| c | 16.977 ± 0.008 Å |
| α | 90° |
| β | 97.191 ± 0.005° |
| γ | 90° |
| Cell volume | 2859 ± 2 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.111 |
| Residual factor for significantly intense reflections | 0.0841 |
| Weighted residual factors for significantly intense reflections | 0.1815 |
| Weighted residual factors for all reflections included in the refinement | 0.1978 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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