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Information card for entry 7025156
Preview
| Coordinates | 7025156.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H76 Cu2 K2 N4 O8 P4 S8 |
|---|---|
| Calculated formula | C52 H76 Cu2 K2 N4 O8 P4 S8 |
| Title of publication | Copper(I) complexes with N-(diisopropoxythiophosphoryl)thiobenzamide PhC(S)NHP(S)(OiPr)2. |
| Authors of publication | Babashkina, Maria G.; Safin, Damir A.; Fayon, Franck; Rakhmatullin, Aydar I.; Sokolov, Felix D.; Klein, Axel; Krivolapov, Dmitriy B.; Pape, Tania; Hahn, F. Ekkehardt; Kozlowski, Henryk |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2010 |
| Journal volume | 39 |
| Journal issue | 35 |
| Pages of publication | 8261 - 8268 |
| a | 49.35 ± 0.005 Å |
| b | 18.9378 ± 0.0017 Å |
| c | 30.529 ± 0.003 Å |
| α | 90° |
| β | 95.032 ± 0.001° |
| γ | 90° |
| Cell volume | 28422 ± 5 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1593 |
| Residual factor for significantly intense reflections | 0.047 |
| Weighted residual factors for significantly intense reflections | 0.0843 |
| Weighted residual factors for all reflections included in the refinement | 0.1056 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.792 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.