Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7025222
Preview
| Coordinates | 7025222.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C46 H44 Ir N P2 |
|---|---|
| Calculated formula | C46 H44 Ir N P2 |
| SMILES | [Ir]12345([P](c6c(N2c2c([P]1(c1ccccc1)c1ccccc1)cc(cc2)C)ccc(c6)C)(c1ccccc1)c1ccccc1)[CH]1=[CH]3CC[CH]4=[CH]5CC1 |
| Title of publication | Synthesis and reactivity of rhodium and iridium alkene, alkyl and silyl complexes supported by a phenyl-substituted PNP pincer ligand. |
| Authors of publication | Calimano, Elisa; Tilley, T. Don |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2010 |
| Journal volume | 39 |
| Journal issue | 39 |
| Pages of publication | 9250 - 9263 |
| a | 10.23 ± 0.002 Å |
| b | 10.663 ± 0.002 Å |
| c | 17.091 ± 0.003 Å |
| α | 88.76 ± 0.03° |
| β | 89.08 ± 0.03° |
| γ | 73.16 ± 0.03° |
| Cell volume | 1783.9 ± 0.6 Å3 |
| Cell temperature | 144 ± 2 K |
| Ambient diffraction temperature | 144 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0317 |
| Residual factor for significantly intense reflections | 0.0253 |
| Weighted residual factors for significantly intense reflections | 0.0581 |
| Weighted residual factors for all reflections included in the refinement | 0.0598 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.156 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7025222.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.