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Information card for entry 7026365
Preview
| Coordinates | 7026365.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C19 H26 Cu F6 Fe P Se4 |
|---|---|
| Calculated formula | C19 H26 Cu F6 Fe P Se4 |
| SMILES | [Se]12[Cu]34[Se](CCC2)CCC[Se]3CCC[Se]4[c]23[Fe]456789%10([cH]2[cH]4[cH]5[cH]36)[cH]2[cH]7[cH]8[cH]9[c]1%102.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | 1,5,9,13-Tetraselena[13]ferrocenophane: synthesis, complexation, crystallographic and electrochemical study. |
| Authors of publication | Jing, Su; Morley, Christopher P.; Gu, Cheng-Yun; Di Vaira, Massimo |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2010 |
| Journal volume | 39 |
| Journal issue | 37 |
| Pages of publication | 8812 - 8819 |
| a | 19.221 ± 0.004 Å |
| b | 10.995 ± 0.002 Å |
| c | 12.001 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2536.2 ± 0.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 29 |
| Hermann-Mauguin space group symbol | P c a 21 |
| Hall space group symbol | P 2c -2ac |
| Residual factor for all reflections | 0.0874 |
| Residual factor for significantly intense reflections | 0.0455 |
| Weighted residual factors for significantly intense reflections | 0.0521 |
| Weighted residual factors for all reflections included in the refinement | 0.0596 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.924 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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