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Information card for entry 7027600
Preview
| Coordinates | 7027600.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H26 Ag O2 P S2 |
|---|---|
| Calculated formula | C28 H26 Ag O2 P S2 |
| SMILES | C(=O)(C)S[Ag]SC(=O)C.c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Chemistry of thiocarboxylates: syntheses and characterization of silver and copper thiocarboxylate complexes, and the structures of [Ph4P][M(SC{O}Me)2] (M = Cu or Ag) and [Et3NH][Ag(SC{O}Ph)2] |
| Authors of publication | Sampanthar, Jeyagowry T.; Vittal, Jagadese J.; Dean, Philip A. W. |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 1999 |
| Journal issue | 18 |
| Pages of publication | 3153 |
| a | 11.7596 ± 0.0001 Å |
| b | 11.7596 ± 0.0001 Å |
| c | 19.1859 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2653.18 ± 0.05 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 114 |
| Hermann-Mauguin space group symbol | P -4 21 c |
| Hall space group symbol | P -4 2n |
| Residual factor for all reflections | 0.0455 |
| Residual factor for significantly intense reflections | 0.0332 |
| Weighted residual factors for all reflections | 0.0851 |
| Weighted residual factors for significantly intense reflections | 0.0799 |
| Goodness-of-fit parameter for all reflections | 1.061 |
| Goodness-of-fit parameter for significantly intense reflections | 1.11 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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