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Information card for entry 7027810
Preview
| Coordinates | 7027810.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C80 H176 Ag10 La2 N16 O16 S32 W8 |
|---|---|
| Calculated formula | C80 Ag10 La2 N16 O16 S32 W8 |
| Title of publication | The unconventional semiconductors represent two novel structure types of polythiometalates: syntheses, structures and electrical properties of {[W3Ag3S12]·[La(DMAC)5(H2O)3·(DMAC)4]}n and {[W8Ag10S32]·[M(DEF)8]2}n (M = La, Nd) † |
| Authors of publication | Chen, Ling; Wu, Xin-tao; Gao, Xian-cheng; Zhang, Wen-jian; Lin, Ping |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 1999 |
| Journal issue | 24 |
| Pages of publication | 4303 |
| a | 21.6534 ± 0.0003 Å |
| b | 18.1125 ± 0.0001 Å |
| c | 22.1818 ± 0.0003 Å |
| α | 90° |
| β | 108.531 ± 0.001° |
| γ | 90° |
| Cell volume | 8248.58 ± 0.17 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1648 |
| Residual factor for significantly intense reflections | 0.084 |
| Weighted residual factors for all reflections | 0.2034 |
| Weighted residual factors for significantly intense reflections | 0.1668 |
| Goodness-of-fit parameter for all reflections | 1.045 |
| Goodness-of-fit parameter for significantly intense reflections | 1.215 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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