Information card for entry 7027911

Structure parameters

• Formula: C54 H80 N4 Si6 Sn
• Calculated formula: C54 H80 N4 Si6 Sn
• SMILES: [Sn]12(N([Si](C)(C)C)C(=[N]1C(=C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1)c1ccccc1)N([Si](C)(C)C)C(=[N]2C(c1ccccc1)=C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1.c1ccccc1
• Title of publication: Metal (Li, K, SnII and HgII) complexes of the 1,3-diazaallyl [N(R)C(Ph)NC(Ph)CR2]− (R = SiMe3)
• Authors of publication: Hitchcock, Peter B.; Lappert, Michael F.; Layh, Marcus
• Journal of publication: Journal of the Chemical Society, Dalton Transactions
• Year of publication: 1998
• Journal issue: 18
• Pages of publication: 3113
• a: 12.307 ± 0.003 Å
• b: 13.096 ± 0.002 Å
• c: 19.767 ± 0.003 Å
• α: 101.837 ± 0.01°
• β: 103.245 ± 0.015°
• γ: 94.27 ± 0.02°
• Cell volume: 3010.4 ± 1 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0834
• Residual factor for significantly intense reflections: 0.0498
• Weighted residual factors for all reflections: 0.1113
• Weighted residual factors for significantly intense reflections: 0.0973
• Goodness-of-fit parameter for all reflections: 1.034
• Goodness-of-fit parameter for significantly intense reflections: 1.082
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No