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Information card for entry 7029111
Preview
| Coordinates | 7029111.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | bis(1,2-bis(methylthio)ethane)diiodoaluminium tetraiodoaluminate |
|---|---|
| Formula | C8 H20 Al2 I6 S4 |
| Calculated formula | C8 H20 Al2 I6 S4 |
| SMILES | [Al]12(I)(I)([S](C)CC[S]1C)[S](C)CC[S]2C.[Al](I)(I)(I)[I-] |
| Title of publication | Thio-, seleno- and telluro-ether complexes of aluminium(iii) halides: synthesis, structures and properties. |
| Authors of publication | George, Kathryn; Jura, Marek; Levason, William; Light, Mark E.; Reid, Gillian |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 9 |
| Pages of publication | 3637 - 3648 |
| a | 14.825 ± 0.003 Å |
| b | 12.181 ± 0.002 Å |
| c | 15.15 ± 0.004 Å |
| α | 90° |
| β | 108.449 ± 0.008° |
| γ | 90° |
| Cell volume | 2595.2 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1353 |
| Residual factor for significantly intense reflections | 0.0571 |
| Weighted residual factors for significantly intense reflections | 0.1063 |
| Weighted residual factors for all reflections included in the refinement | 0.1154 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.799 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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