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Information card for entry 7029529
Preview
| Coordinates | 7029529.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H46 Ir N P2 |
|---|---|
| Calculated formula | C26 H46 Ir N P2 |
| SMILES | C1=C[P](C(C)(C)C)(C(C)(C)C)[IrH]2(c3ccccc3)N1C=C[P]2(C(C)(C)C)C(C)(C)C |
| Title of publication | [IrCl{N(CHCHPtBu2)2}](-): a versatile source of the Ir(I)(PNP) pincer platform. |
| Authors of publication | Kinauer, Markus; Scheibel, Markus G.; Abbenseth, Josh; Heinemann, Frank W.; Stollberg, Peter; Würtele, Christian; Schneider, Sven |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 11 |
| Pages of publication | 4506 - 4513 |
| a | 8.896 ± 0.002 Å |
| b | 29.428 ± 0.007 Å |
| c | 10.601 ± 0.002 Å |
| α | 90° |
| β | 100.058 ± 0.005° |
| γ | 90° |
| Cell volume | 2732.6 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0615 |
| Residual factor for significantly intense reflections | 0.0494 |
| Weighted residual factors for significantly intense reflections | 0.1477 |
| Weighted residual factors for all reflections included in the refinement | 0.1545 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.134 |
| Diffraction radiation wavelength | 0.56086 Å |
| Diffraction radiation type | AgKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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