Information card for entry 7030358

Structure parameters

• Formula: C81.4 H196.6 Cl1.4 Cu12 N12 O59.2 Y4
• Calculated formula: C81.4 H196.6 Cl1.4 Cu12 N12 O59.2 Y4
• Title of publication: Semiconducting composite oxide Y2CuO4-5CuO thin films for investigation of photoelectrochemical properties.
• Authors of publication: Ahmed, Sohail; Mansoor, Muhammad Adil; Mazhar, Muhammad; Söhnel, Tilo; Khaledi, Hamid; Basirun, Wan Jefrey; Arifin, Zainudin; Abubakar, Shahzad; Muhammad, Bakhtiar
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2014
• Journal volume: 43
• Journal issue: 22
• Pages of publication: 8523 - 8529
• a: 22.3199 ± 0.0009 Å
• b: 13.7789 ± 0.0006 Å
• c: 23.233 ± 0.001 Å
• α: 90°
• β: 105.863 ± 0.003°
• γ: 90°
• Cell volume: 6873.1 ± 0.5 ų
• Cell temperature: 80 ± 2 K
• Ambient diffraction temperature: 80 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0761
• Residual factor for significantly intense reflections: 0.0393
• Weighted residual factors for significantly intense reflections: 0.0787
• Weighted residual factors for all reflections included in the refinement: 0.0905
• Goodness-of-fit parameter for all reflections included in the refinement: 1.038
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No