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Information card for entry 7030482
Preview
| Coordinates | 7030482.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H29.08 Cl Cu N2 O1.04 |
|---|---|
| Calculated formula | C22 H29 Cl Cu N2 O1.04167 |
| Title of publication | Structural studies of copper(ii) complexes with 2-(2-aminoethyl)pyridine derived Schiff bases and application as precursors of thin organic-inorganic layers. |
| Authors of publication | Barwiolek, Magdalena; Szlyk, Edward; Berg, Andrzej; Wojtczak, Andrzej; Muziol, Tadeusz; Jezierska, Julia |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 26 |
| Pages of publication | 9924 - 9933 |
| a | 15.8718 ± 0.0002 Å |
| b | 15.8718 ± 0.0002 Å |
| c | 15.8718 ± 0.0002 Å |
| α | 106.639 ± 0.001° |
| β | 106.639 ± 0.001° |
| γ | 106.639 ± 0.001° |
| Cell volume | 3362.1 ± 0.09 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :R |
| Hall space group symbol | -P 3* |
| Residual factor for all reflections | 0.0548 |
| Residual factor for significantly intense reflections | 0.0381 |
| Weighted residual factors for significantly intense reflections | 0.106 |
| Weighted residual factors for all reflections included in the refinement | 0.1103 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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