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Information card for entry 7030537
Preview
| Coordinates | 7030537.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C17 H11 F6 N5 O7 Pd S2 |
|---|---|
| Calculated formula | C17 H11 F6 N5 O7 Pd S2 |
| SMILES | [Pd]12([n]3ccccc3c3cccc([n]13)c1cccc[n]21)ON(=O)=O.N(=S([O-])(=O)C(F)(F)F)S(=O)(=O)C(F)(F)F |
| Title of publication | Is bis(trifluoromethylsulfonyl)amide an innocent anion? X-Ray structure data and DFT calculations |
| Authors of publication | Illner, Peter; Puchta, Ralph; Heinemann, Frank W.; van Eldik, Rudi |
| Journal of publication | Dalton Transactions |
| Year of publication | 2009 |
| Journal issue | 15 |
| Pages of publication | 2795 - 2801 |
| a | 8.4578 ± 0.0005 Å |
| b | 8.985 ± 0.0003 Å |
| c | 15.7908 ± 0.0012 Å |
| α | 75.595 ± 0.004° |
| β | 76.794 ± 0.006° |
| γ | 74.882 ± 0.004° |
| Cell volume | 1104.74 ± 0.12 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0369 |
| Residual factor for significantly intense reflections | 0.0266 |
| Weighted residual factors for significantly intense reflections | 0.0628 |
| Weighted residual factors for all reflections included in the refinement | 0.0658 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.112 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Duplicate of | 7000998 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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