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Information card for entry 7030792
Preview
| Coordinates | 7030792.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H32 F10 P4 Ta2 |
|---|---|
| Calculated formula | C20 H32 F10 P4 Ta2 |
| SMILES | [Ta](F)(F)(F)(F)(F)[F-].[Ta]12([P](c3c([P]1(C)C)cccc3)(C)C)([P](c1c([P]2(C)C)cccc1)(C)C)(F)(F)(F)F |
| Title of publication | Soft diphosphine and diarsine complexes of niobium(v) and tantalum(v) fluorides: synthesis, properties, structures and comparisons with the corresponding chlorides. |
| Authors of publication | Levason, William; Light, Mark E.; Reid, Gillian; Zhang, Wenjian |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 25 |
| Pages of publication | 9557 - 9566 |
| a | 12.253 ± 0.002 Å |
| b | 12.348 ± 0.002 Å |
| c | 12.481 ± 0.002 Å |
| α | 114.629 ± 0.002° |
| β | 110.486 ± 0.003° |
| γ | 101.38 ± 0.03° |
| Cell volume | 1471.7 ± 0.6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0625 |
| Residual factor for significantly intense reflections | 0.0577 |
| Weighted residual factors for significantly intense reflections | 0.184 |
| Weighted residual factors for all reflections included in the refinement | 0.1857 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.286 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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