Information card for entry 7031385

Structure parameters

• Formula: C80 H156 N4 O16 Sr4
• Calculated formula: C80 H156 N4 O16 Sr4
• SMILES: [Sr]1234(OC(=CC(=[O]1)C(C)(C)C)C(C)(C)C)[O]1(C(C)(C)C[O]2CCCN(C)C)[Sr]256(OC(=CC(=[O]2)C(C)(C)C)C(C)(C)C)[O]3(C(C)(C)C[O]5CCCN(C)C)[Sr]235(OC(=CC(=[O]2)C(C)(C)C)C(C)(C)C)[O]6(C(C)(C)C[O]3CCCN(C)C)[Sr]231(OC(=CC(=[O]2)C(C)(C)C)C(C)(C)C)[O]45C(C)(C)C[O]3CCCN(C)C
• Title of publication: Synthesis of new heteroleptic strontium complexes.
• Authors of publication: George, Sheby Mary; Kim, Hyo-Suk; Lah, Myoung Soo; Park, Bo Keun; Kim, Chang Gyoun; Chung, Taek-Mo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2014
• Journal volume: 43
• Journal issue: 38
• Pages of publication: 14461 - 14469
• a: 26.451 ± 0.004 Å
• b: 26.451 ± 0.004 Å
• c: 13.425 ± 0.003 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 9393 ± 3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 88
• Hermann-Mauguin space group symbol: I 41/a :2
• Hall space group symbol: -I 4ad
• Residual factor for all reflections: 0.0904
• Residual factor for significantly intense reflections: 0.0508
• Weighted residual factors for significantly intense reflections: 0.1035
• Weighted residual factors for all reflections included in the refinement: 0.1205
• Goodness-of-fit parameter for all reflections included in the refinement: 1.07
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No